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A Qubeä module is an instrument that combines ThetaDelta’s unique temperature control technology with electrical source and measurement capabilities. This combination creates a unified thermal and electrical platform for the thermal testing of electronic devices. The QUBE takes its name from it cube shape and the symbol for heat (Q). Qube technology uses an innovative temperature controlling technique for burn-in and life testing of semiconductor devices. It utilizes a "closed loop" conductive heating and cooling technique for DUT (Device Under Test)) case temperature control. This technique offers a dramatic improvement in temperature control over the traditional forced air or liquid bath methods of burn-in. High accuracy case-temperature control is achieved by very low thermal resistance between the DUT and the Qube’s thermal head, and the utilization of unique temperature sensing circuitry.
Each Qube contains a patented Bak-Pak™ heating and cooling thermal head, which maintains a user-programmed temperature setpoint, or performs temperature cycling, under the control of a local microprocessor. Qube operation is set up using turn-key Bak-Pak software running on a system host computer. A Qube contains primary sensors for controlling DUT temperature and, optionally, auxiliary sensors for additional monitoring purposes. The Qube perfo rms thermal and electrical control of an entire test-site independently of the system’s host computer. The system computer initializes the Qube at the beginning of a burn-in or life-test cycle with thermal bias, DC bias, RF bias and digital signaling based on user-configured files. The Qube then takes complete control of test site operation including monitoring and data logging of thermal and electrical bias conditions. The system computer periodically polls each Qube site for status. Abnormal or faulty operating conditions will cause an automatic shutdown or warning to be generated by the Qube. A standard QUBE site contains up to 12 high-power programmable voltage sources with an additional 12 low-power sources, for independent biasing of 12 DUTS ( 12 Vdd and 12 Vgg sources, for example) . These regulated voltage sources include voltage and current readback capability. Additional electronics such as digital signaling or RF sources are controlled via the Qube’s peripheral control bus. Qube sites are generally configured according to customer specifications. Applications vary from 100-DUT laser diode Qubes, to 30-DUT Qubes for DC characterization of RF semiconductors, and Qubes for burn-in of high-power satellite communication modules. Key Benefits
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